Welcome to the International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)

September 8-12, 2019 * Berlin, Germany

The DRIP XVIII conference will be held in Berlin, Germany, September 8-12, 2019.

The conference focuses on all aspects of defects in semiconductors including point, line, planar and volume defects studied by a variety of tools. Most recent advances in the field of defect analysis will be discussed. This comprehensive approach has allowed for a discussion of the multifaceted effects of growth, processing, device fabrication as well as their interrelationships, and how to approach the study of defects.

The conference provides an outstanding international forum to present and discuss the correlation between crystal defects, device fabrication and degradation.

 

Previous conferences

DRIP XVII in 2017, Valladolid, Spain
DRIP XVI in 2015, Suzhou, China
DRIP XV in 2013, Warsaw, Poland
DRIP XIV in 2011, Miyazaki, Japan
DRIP XIII in 2009, Wheeling, West Virginia, USA
DRIP XII in 2007, Berlin, Germany